CAPITOLE-EM
CAPITOLE-EM software allows to study the electromagnetic behavior of your products in order to test your designs before the manufacturing phase. The simulation allows you to reduce the number of prototypes needed before launching your production and thus reduce your costs.
It includes three offers:
- standard license,
- agile personalized license by a specific development,
- license increased by a study carried out by our engineers.
CAPITOLE-EM simulates electromagnetic fields from radiating devices such as antennas and their interactions with the structure (plane, car, frigate...). With a modern and intuitive graphical interface, it can be used in a wide variety of applications and provides fast and accurate results. Two modules: ANTENNA and RCS are currently available and can meet your needs in these application areas.
The new solver ACA-CBD, based on the compression matrix, resulting from innovation projects supported by the DGA, is 10 times faster than conventional methods and without loss of accuracy and without any convergence problem.
Measuring systems
BAT-SCANNER
Based on the measurement, analysis and post-processing methods issued from the EPEA (www.epea.fr) innovative research project, nexio group industrializes EMC near-field measurements with a 3D scanner.
Thanks to the capitalization of accumulated results during our participation in various research projects (EPEA, PCB, SEISME) nexio group is the first company to have developed a complete range of products on near-field measurement.
This product range includes:
- BAT-SCANNER: A 3D high-precision robotic measuring bench.
- BAT-SCAN: An advanced control and near-field measuring bench automation software.
- NFS Viewer: Dedicated software for analysis and post-processing of data measurement and near-field simulation.
With this new range of tools, nexio group brings you real solution to reduce both your design and qualification time as well as the cards and electronic equipment maintenance.
The near-field scanner, BAT-SCANNER, can be piloted thanks to BAT-SCAN, our test automation software.
ADVANTAGES :
- Design phase:
-> Locate and reduce sources
-> Positionning and routing optimization
-> Help with technological choices
-> Establish databases
-> Investigate EMI defects - Product life phase:
-> Check the non-regression
-> Manage obsolescence
-> Capitalize on experience feedback - Production phase:
-> Characterize leaks
-> Evaluate subcontractors and 2nd source
-> Control manufacturing
CAPITOLE-RCS : Radar signature software
5 Reasons to choose CAPITOLE-RCS
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DESIGNER Component :
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Solver:
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SOFTWARE OFFERS
SERVICES OFFERS
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POSTPRO3D Component:
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CAPITOLE-RF : Antenna design software
5 Reasons to choose CAPITOLE-RF
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Software resulting from innovative projects PEA IASP (2008-10)
CAPITOLE-HPC (2012-13)
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Designer component:
Antenna placement Optimization:
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Results:
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POSTPRO3D composent:
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SOFTWARE OFFERS
SERVICES OFFERS
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Solver:
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BAT-SCANNER
Based on the measurement, analysis and post-processing methods issued from the EPEA (www.epea.fr) innovative research project, NEXIO industrializes EMC near-field measurements with a 3D scanner.
Thanks to the capitalization of accumulated results during our participation in various research projects (EPEA, PCB, SEISME) NEXIO is the first company to have developed a complete range of products on near-field measurement.
This product range includes:
- BAT-SCANNER: A 3D high-precision robotic measuring bench.
- BAT-SCAN: An advanced control and near-field measuring bench automation software.
- NFS Viewer: Dedicated software for analysis and post-processing of data measurement and near-field simulation.
With this new range of tools, NEXIO brings you real solution to reduce both your design and qualification time as well as the cards and electronic equipment maintenance.
The near-field scanner, BAT-SCANNER, can be piloted thanks to BAT-SCAN, our test automation software.
ADVANTAGES:
- Design phase:
-> Locate and reduce sources
-> Positionning and routing optimization
-> Help with technological choices
-> Establish databases
-> Investigate EMI defects - Product life phase:
-> Check the non-regression
-> Manage obsolescence
-> Capitalize on experience feedback - Production phase:
-> Characterize leaks
-> Evaluate subcontractors and 2nd source
-> Control manufacturing